Scaling Short‐Wave Infrared Detector Pixels to Subwavelength Dimensions

View at publisher
Authors: Shengmei Gao, Xiaolu Xia, Tao Luo, Ying Yan, Fengyuan Han, Hongkun Duan, Jiawen Wu, Yu Cao, Haowen Shu, Jianhua Jiang, Ying Wang, Zhiyong Zhang
Cited by: 0
References: 29

Abstract

ABSTRACT Pixel miniaturization is crucial for advancing high‐resolution short‐wave infrared (SWIR) imaging, particularly for remote sensing, consumer electronics, and portable platforms. However, conventional epitaxial photodiode technologies have been limited to approximately 10 µm pixels, and systematic investigations of pixel miniaturization limits in SWIR detection are lacking. Here, we report the pixel scaling behavior of carbon nanotube (CNT) film heterojunction‐gated field‐effect transistor (HGFET) detectors and demonstrate the feasibility and performance improvement of subwavelength pixel SWIR detectors. Specifically, the main performance indicators of the HGFET detectors consistently improve, particularly the specific detectivity and response speed as the pixel is scaled from 5.5 to 1.0 µm. A HGFET detector with a subwavelength pitch of 0.65λ (∼1.0 µm) has a record specific detectivity exceeding 10 15 cm·Hz 1/2 ·W −1 at 1300 nm and rise/fall times of 132/148 µs. Through their compatibility with silicon‐based readout circuits, submicron‐pixel CNT HGFET arrays offer scalable and cost‐effective platforms for next‐generation high‐resolution SWIR imaging systems.

Fields of Study & Subjects

Advanced Semiconductor Detectors and Materials CCD and CMOS Imaging Sensors 2D Materials and Applications

Publication details

Journal / source
Advanced Materials
Volume
38
Issue
12
Pages
e17878–e17878
Publication date
12 January 2026
Language
EN