Simultaneous Determination of Transition Dipole Moment Orientation and Refractive Index in Morphologically Non‐Uniform Nanoscale Films (Advanced Optical Materials 2/2026)

Advanced Optical Materials 2026 Open access

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Authors: Donghyeon Shin, Seungyeon Cho, Jae‐Hyun Lee, Kyusung Choi, Jinwon Jun, M. J. Shin, Dong Jin Shin, Seokho Kim, Jae-Min Myoung, Jun Yeob Lee, Jaesang Lee, Namyoung Ahn
+2 more Kyusang Lee, Jongchan Kim
DOI: 10.1002/adom.70720
Cited by: 0

Abstract

Transition Dipole Moments Fourier-plane imaging microscopy enables simultaneous determination of transition dipole moment orientation and refractive index in morphologically non-uniform nanoscale films, providing a powerful tool for advancing various LEDs and nanophotonic device design. More details can be found in the Research Article by Namyoung Ahn, Kyusang Lee, Jongchan Kim, and co-workers (DOI: 10.1002/adom.202502019).

Fields of Study & Subjects

Plasmonic and Surface Plasmon Research Advanced Fluorescence Microscopy Techniques Luminescence Properties of Advanced Materials

Publication details

Journal / source
Advanced Optical Materials
Volume
14
Issue
2
Publication date
1 January 2026
Language
EN