Aging and Electrical Stability of DNTT Honey‐Gated OFETs

ABSTRACT Developing transistors that combine high electrical performance, operational stability, and environmental sustainability remains a challenge. Electrolyte‐gated organic field‐effect transistors (EGOFETs) address this issue by replacing the insulating layer with sustainable electrolytes, enabling low‐voltage operation and biosensing capabilities. In this work, we demonstrate honey‐gated OFETs using natural honey as a sustainable electrolyte and dinaphtho[2,3‐b:2',3'‐f]thieno[3,2‐b]thiophene (DNTT) as the active layer. The devices exhibited an I on /I off ≈ 10 3 , a transconductance of 10.42 µS, and a low threshold voltage of −0.74 V. Stability was assessed through short‐term tests (five days, 40 sweeps/day), revealing minimal parameter shifts, and long‐term tests (five weeks, 15 sweeps/week), showing gradual degradation. The device continued to operate with high performance after the honey droplet was removed and a fresh one was reapplied onto the DNTT. Under pulsed gate operation, the drain current switched by three orders of magnitude within 4 s, confirming fast, reversible gating and the absence of permanent channel doping or chemical reactions. The observed performance decline stems from structural disorder and trap formation induced by aging. Overall, DNTT honey‐gated OFETs exhibit stable operation for at least a short period before gradual degradation, highlighting their potential as a platform for sustainable electronics.