Addendum to: Magnetic Field Screening of 2D Materials Revealed by Magnetic Force Microscopy

ABSTRACT In our original publication, “Magnetic field screening of 2D materials revealed by magnetic force microscopy,” we demonstrated that few‐layer graphene (FLG) exhibits a measurable magnetic field screening effect of approximately 0.5% per graphene layer, as revealed by magnetic force microscopy (MFM). Here, we focus on the broader implications of this phenomenon for devices employing FLG as electrodes in van der Waals heterostructures. We highlight that the cumulative diamagnetic screening of FLG can substantially reduce the effective magnetic field experienced by the active region of a device, which must be considered for accurate quantitative interpretation of magnetic field‐dependent measurements. This Addendum clarifies how FLG's intrinsic diamagnetism can influence quantitative analyses and theoretical comparisons, while leaving the qualitative conclusions of our original study unaffected.