A Novel Risk Stratification Tool for Sinonasal Inverted Papilloma Recurrence: Multi‐Institutional Nomogram Incorporating Dysplasia Severity

International Forum of Allergy & Rhinology 2026

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Authors: Tristan Tham, Peter S Giannaris, Mostafa Kokabee, Alexis H. Kim, Jadyn Wilensky, C. Y. Tsang, Beverly Y. Wang, Kush Panara, Edward C. Kuan, P. Papagiannopoulos, Bobby Tajudeen, Jacob G. Eide
+19 more John Pierre (JP) Craig, Rijul S. Kshirsagar, Zachary K. Christian, Tran B. Locke, Judd H. Fastenberg, Mark B. Chaskes, Aron Z. Pollack, Gady Har‐El, Shengjie Cui, Dominick R. Guerrero, Seungjun Ahn, Eun Jeong Oh, David W. Kennedy, Alan D. Workman, Michael A. Kohanski, Jennifer Douglas, Nithin D. Adappa, James N. Palmer, Charles C. L. Tong
DOI: 10.1002/alr.70102
Cited by: 1
References: 8

Abstract

KEY POINTS: High-risk dysplasia and multifocal attachment independently predict inverted papilloma recurrence. Novel nomogram generates individualized 3-, 6-, and 9-year recurrence risk estimates. Risk-stratified surveillance may optimize postoperative monitoring intensity and intervals.

Fields of Study & Subjects

Head and Neck Surgical Oncology Sinusitis and nasal conditions Nasal Surgery and Airway Studies

Publication details

Journal / source
International Forum of Allergy & Rhinology
Publisher
Wiley
Volume
16
Issue
3
Pages
287–291
Publication date
9 January 2026
Language
EN