Study of the Secondary Electron Emission Suppression of TiN Coating on Polyimide Film Material
Abstract
Polyimide materials (PIs) are extensively used in aerospace applications due to their superior mechanical and thermal properties. However, their high secondary electron emission yield (SEY) poses significant challenges. To decrease the SEY of material, this study employed the magnetron sputtering technique to deposit TiN coatings of varying thicknesses onto PI surface. The results indicated that TiN coatings significantly reduced the secondary electron emission (SEE) of PI materials. Specifically, a 400‐nm TiN coating decreased the maximum SEY from 1.72 to 1.07. The results demonstrate that TiN coatings are effective in suppressing SEE, thereby indicating their considerable potential for aerospace technological applications.
Fields of Study & Subjects
Electron and X-Ray Spectroscopy Techniques
Surface Modification and Superhydrophobicity
Silicone and Siloxane Chemistry
Publication details
- Journal / source
- physica status solidi (b)
- Publisher
- Wiley
- Volume
- 263
- Issue
- 3
- Publication date
- 1 March 2026
- Language
- EN