YOLO Assisted SAM: A Two-Stage Deep Learning Framework for Automated PCB Defect Detection and Segmentation

Smart innovation, systems and technologies 2026

View at publisher
Authors: A. J. Mageshwari, R. Jothi Prabha, N. Karthiga, R. R. Lekshmi
DOI: 10.1007/978-3-032-12983-3_40
Cited by: 1
References: 18

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Handwritten Text Recognition Techniques

Publication details

Journal / source
Smart innovation, systems and technologies
Publisher
Springer Nature Switzerland
Pages
416–425
Publication date
1 January 2026
Language
EN