Explainable AI Empowered Deep Learning-Based Framework for Fabric Defect Prediction

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Authors: Simran Sagar, Arpita Jain, Shruti Bansal, Harshita Deep, Dipty Tripathi, Poonam Bansal
Cited by: 0
References: 21

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Non-Destructive Testing Techniques Advanced Neural Network Applications

Publication details

Journal / source
Lecture notes in networks and systems
Pages
376–390
Publication date
1 January 2026
Language
EN