Masked Autoencoder Self Pre-Training for Defect Detection in Microelectronics

Communications in computer and information science 2026 Open access

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Authors: Nikolai Röhrich, Alwin Hoffmann, Richard Nordsieck, Emilio Zarbali, Alireza Javanmardi
DOI: 10.1007/978-3-032-19108-3_9
Cited by: 0

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection

Publication details

Journal / source
Communications in computer and information science
Pages
138–153
Publication date
1 January 2026
Language
EN