Error-Correcting and Modulation Codes for Reliability STT-MRAM Memory: A Review

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Authors: Thanh-Loc Nguyen-Van, Tan Do-Duy, Chi Dinh Nguyen
Cited by: 1
References: 37

Fields of Study & Subjects

Magnetic properties of thin films Optical Network Technologies Ferroelectric and Negative Capacitance Devices

Publication details

Journal / source
Communications in computer and information science
Publisher
Springer Nature Switzerland
Pages
167–180
Publication date
1 January 2026
Language
EN