Complete FSM Testing Using Strong Separability

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Authors: Robert M. Hierons, Mohammad Reza Mousavi
Cited by: 0

Fields of Study & Subjects

Non-Destructive Testing Techniques Integrated Circuits and Semiconductor Failure Analysis Ultrasonics and Acoustic Wave Propagation

Publication details

Journal / source
Lecture notes in computer science
Pages
328–349
Publication date
1 January 2026
Language
EN