BAAF: Universal Transformation of One-Class Classifiers for Unsupervised Image Anomaly Detection

Lecture notes in computer science 2026 Open access

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Authors: Declan McIntosh, Alexandra Branzan Albu
DOI: 10.1007/978-3-032-37432-5_20
Cited by: 0

Fields of Study & Subjects

Anomaly Detection Techniques and Applications Industrial Vision Systems and Defect Detection Adversarial Robustness in Machine Learning

Publication details

Journal / source
Lecture notes in computer science
Pages
348–366
Publication date
1 January 2026
Language
EN