A Method for Determination of Minimum Possible Gate Length of A Double Gate Junctionless Field Effect Transistor
Fields of Study & Subjects
Advancements in Semiconductor Devices and Circuit Design
Semiconductor materials and devices
Integrated Circuits and Semiconductor Failure Analysis
Publication details
- Journal / source
- Springer Proceedings in Materials
- Pages
- 101–109
- Publication date
- 1 January 2026
- Language
- EN