Model-Based Prognosis for Hybrid Systems: A Perspective of Patent

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Authors: Hong-Wen Tsai
Cited by: 0
References: 3

Fields of Study & Subjects

Fault Detection and Control Systems Machine Fault Diagnosis Techniques VLSI and Analog Circuit Testing

Publication details

Journal / source
Lecture notes in electrical engineering
Pages
113–121
Publication date
1 January 2026
Language
EN