IEDD-Net: Industrial Endoscope Defect Detection Network Based on Improved YOLOv12n

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Authors: Xuqi Bai, Lanjun Wan, JieHui Ke, Haixia Luo, Wei Ni
Cited by: 0
References: 13

Fields of Study & Subjects

Advanced Neural Network Applications Industrial Vision Systems and Defect Detection Infrastructure Maintenance and Monitoring

Publication details

Journal / source
Communications in computer and information science
Pages
277–290
Publication date
1 January 2026
Language
EN