Automated Signal Processing for Crystallite Size Estimation from XRD Data: A Simplified Alternative to Advanced Microscopy

Lecture notes in networks and systems 2026

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Authors: Vaishnavi N. Halarnkar, Priyanka Nehla, Sandeep Munjal
DOI: 10.1007/978-981-95-3486-9_5
Cited by: 0
References: 25

Fields of Study & Subjects

X-ray Diffraction in Crystallography Electron and X-Ray Spectroscopy Techniques Machine Learning in Materials Science

Publication details

Journal / source
Lecture notes in networks and systems
Pages
53–64
Publication date
1 January 2026
Language
EN