Imaging of Internal Current Distribution in Press Pack IGBTs Based on External Magnetic Field Measurements

View at publisher
Authors: Huan Niu, Yong Yang, Yuanfang Lu, Wei Zheng, Yirun Ji, Xi Yuan, Qing Huai, Lei Qi
Cited by: 0
References: 3

Fields of Study & Subjects

Magnetic Field Sensors Techniques Silicon Carbide Semiconductor Technologies Non-Destructive Testing Techniques

Publication details

Journal / source
Lecture notes in electrical engineering
Pages
326–333
Publication date
1 January 2026
Language
EN