Research on Evaluation Methods for Composite Aging Characteristics of SiC MOSFETs

Lecture notes in electrical engineering 2026

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Authors: Rui Yang, Haoran Zhang, Yumeng Cai, Peng Sun, Zhibin Zhao, Qingmeng Meng, Zezhou Chang
DOI: 10.1007/978-981-95-4290-1_32
Cited by: 0
References: 11

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Radiation Effects in Electronics Semiconductor materials and devices

Publication details

Journal / source
Lecture notes in electrical engineering
Pages
289–296
Publication date
1 January 2026
Language
EN