Enhanced Reliability Architecture for VLSI Systems Using the IRMC Algorithm for Error Detection and Correction

Lecture notes in electrical engineering 2026 Book chapter

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Authors: G. Shanthi, Sk. Shoukath Vali, Uppala Bhargava Sai, K. L. V. Ramana Kumari, S. Naga Leela, A. Ramesh Kumar, K. Srinivas Rao
DOI: 10.1007/978-981-95-4415-8_7
Cited by: 1
References: 10

Fields of Study & Subjects

Radiation Effects in Electronics Physical Unclonable Functions (PUFs) and Hardware Security Interconnection Networks and Systems

Publication details

Journal / source
Lecture notes in electrical engineering
Publisher
Springer Nature Singapore
Pages
121–138
Publication date
1 January 2026
Language
EN
Document type
Book chapter