SAPAG: Self-attention Parts Guidance with Latent Diffusion Models for Anomaly Detection in Microscopy Images
Fields of Study & Subjects
Anomaly Detection Techniques and Applications
Cell Image Analysis Techniques
Industrial Vision Systems and Defect Detection
Publication details
- Journal / source
- Lecture notes in computer science
- Pages
- 52–66
- Publication date
- 1 January 2026
- Language
- EN