Robust Label Shift Correction via Denoising Expectation-Maximization

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Authors: Xiaowen Wu, Ruidong Fan, Chenping Hou
Cited by: 0
References: 14

Fields of Study & Subjects

Domain Adaptation and Few-Shot Learning Machine Learning and Data Classification Adversarial Robustness in Machine Learning

Publication details

Journal / source
Lecture notes in computer science
Pages
60–74
Publication date
1 January 2026
Language
EN