SLI-Net: Efficient Lightweight Networks Focused on Critical Defect Detection

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Authors: Xin Wang, Ziyang Li, Jiong Yu, Zeyu Lin, Wenrui Sun
Cited by: 0
References: 16

Fields of Study & Subjects

Advanced Neural Network Applications Industrial Vision Systems and Defect Detection Domain Adaptation and Few-Shot Learning

Publication details

Journal / source
Lecture notes in computer science
Pages
118–135
Publication date
1 January 2026
Language
EN