YOLO-FDA: Integrating Hierarchical Attention and Detail Enhancement for Surface Defect Detection

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Authors: Jiawei Hu
Cited by: 4
References: 38

Fields of Study & Subjects

Advanced Neural Network Applications Industrial Vision Systems and Defect Detection Visual Attention and Saliency Detection

Publication details

Journal / source
Lecture notes in computer science
Publisher
Springer Nature Singapore
Pages
190–205
Publication date
1 January 2026
Language
EN