Automated Debugging of Design Errors using Optimized Multi-Component Attention Graph Convolutional Neural Network in Digital VLSI Circuits
Fields of Study & Subjects
VLSI and Analog Circuit Testing
Software Testing and Debugging Techniques
Radiation Effects in Electronics
Publication details
- Journal / source
- Circuits Systems and Signal Processing
- Volume
- 45
- Issue
- 8
- Pages
- 6628–6656
- Publication date
- 9 February 2026
- Language
- EN