Automated Debugging of Design Errors using Optimized Multi-Component Attention Graph Convolutional Neural Network in Digital VLSI Circuits

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Authors: Neeraj Kumar Shukla
Cited by: 0
References: 26

Fields of Study & Subjects

VLSI and Analog Circuit Testing Software Testing and Debugging Techniques Radiation Effects in Electronics

Publication details

Journal / source
Circuits Systems and Signal Processing
Volume
45
Issue
8
Pages
6628–6656
Publication date
9 February 2026
Language
EN