Analog Circuit Fault Diagnosis Based on Gramian Angular Field and Multi-Scale Dual Attention Residual Shrinkage Network

Circuits Systems and Signal Processing 2026

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Authors: Gefei Duan, Yajing Gao, Rui Yang, Junying Yun, Meili Rao, Dong Ye, Xinyi Wei
DOI: 10.1007/s00034-026-03514-5
Cited by: 2
References: 26

Fields of Study & Subjects

VLSI and Analog Circuit Testing Integrated Circuits and Semiconductor Failure Analysis Electrical Fault Detection and Protection

Publication details

Journal / source
Circuits Systems and Signal Processing
Publisher
Springer Science and Business Media LLC
Volume
45
Issue
8
Pages
6265–6288
Publication date
9 February 2026
Language
EN