MOCRN-A Novel Physics-Guided Fault Modeling and Multimodal Neural Network for Fault Identification and Degradation Estimation in Analog Circuits

Circuits Systems and Signal Processing 2026

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Authors: J. P. Teshan Kavindu Jayasinghe, Gayani Pamoda Kulathunga, Rahul Kumar Thakur

DOI: 10.1007/s00034-026-03590-7

Cited by: 1

References: 33

Fields of Study & Subjects

VLSI and Analog Circuit Testing Radiation Effects in Electronics Semiconductor materials and devices

References 33