Design and Fault Detection of Charge Pump PLLs with NAND Gate based PFD Using BPNN and PNN
Fields of Study & Subjects
Advancements in PLL and VCO Technologies
Low-power high-performance VLSI design
VLSI and Analog Circuit Testing
Publication details
- Journal / source
- Circuits Systems and Signal Processing
- Publisher
- Springer Science and Business Media LLC
- Publication date
- 8 July 2026
- Language
- EN