A novel deep learning framework for field-scale wheat yield prediction

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Authors: M Lokeshwari, Girish Kumar Jha, A Praveenkumar, Jyoti Kumari, Sudhir Navathe, Gyanendra Pratap Singh, P V Vara Prasad
Cited by: 1
References: 42

Fields of Study & Subjects

Remote Sensing in Agriculture Smart Agriculture and AI Greenhouse Technology and Climate Control

Publication details

Journal / source
Theoretical and Applied Genetics
Publisher
Springer Science and Business Media LLC
Volume
139
Issue
3
Publication date
25 February 2026
Language
EN