A two-stage lightweight network for real-time IC surface defect detection

The International Journal of Advanced Manufacturing Technology 2026

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Authors: Feng-Cheng Lin, Hui-An Wu, Jia-Yan Lin
DOI: 10.1007/s00170-025-17341-6
Cited by: 0
References: 23

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Infrastructure Maintenance and Monitoring

Publication details

Journal / source
The International Journal of Advanced Manufacturing Technology
Volume
142
Issue
7-8
Pages
3933–3946
Publication date
13 January 2026
Language
EN