Well-Posedness of the Stochastic Thin-Film Equation with an Interface Potential

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Authors: Antonio Agresti, Max Sauerbrey
Cited by: 0
References: 58

Abstract

Abstract We consider strictly positive solutions to a class of fourth-order conservative quasilinear SPDEs on the d -dimensional torus modeled after the stochastic thin-film equation. We prove local Lipschitz estimates in Bessel potential spaces under minimal assumptions on the parameters and corresponding stochastic maximal $$L^p$$ L p -regularity estimates for thin-film type operators with measurable in time coefficients. As a result, we deduce local well-posedness of the stochastic thin-film equation as well as blow-up criteria and instantaneous regularization for the solution. In dimension one, we additionally close $$\alpha $$ α -entropy estimates and subsequently an energy estimate for the stochastic thin-film equation with an interface potential so that global well-posedness follows. We allow for a wide range of mobility functions, including the power laws $$u^n$$ u n for $$n\in [0,6)$$ n ∈ [ 0 , 6 ) as long as the interface potential is sufficiently repulsive.

Fields of Study & Subjects

Fluid Dynamics and Thin Films Advanced Mathematical Modeling in Engineering Solidification and crystal growth phenomena

Publication details

Journal / source
Communications in Mathematical Physics
Publisher
Springer Science and Business Media LLC
Volume
407
Issue
8
Pages
158–158
Publication date
9 July 2026
Language
EN