Thickness effects of SiO2 underlayers on solid-phase-crystallized Ge thin films

Applied Physics A 2026

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Authors: Minji Seo, Jisun Yu, Woong Sik Choi

DOI: 10.1007/s00339-026-09475-5

Cited by: 0

References: 27

Fields of Study & Subjects

Semiconductor materials and interfaces Semiconductor materials and devices Thin-Film Transistor Technologies

References 27