Thickness-controlled a-Si/Cu/a-Si stacks for tunable absorption and dielectric response up to the THz regime

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Authors: Latifah Hamad Khalid Alfhaid, A. F. Qasrawi
Cited by: 1
References: 48

Fields of Study & Subjects

Semiconductor materials and interfaces Plasmonic and Surface Plasmon Research Electromagnetic wave absorption materials

Publication details

Journal / source
Applied Physics A
Publisher
Springer Science and Business Media LLC
Volume
132
Issue
5
Publication date
9 April 2026
Language
EN