Thickness-controlled a-Si/Cu/a-Si stacks for tunable absorption and dielectric response up to the THz regime
Fields of Study & Subjects
Semiconductor materials and interfaces
Plasmonic and Surface Plasmon Research
Electromagnetic wave absorption materials
Publication details
- Journal / source
- Applied Physics A
- Publisher
- Springer Science and Business Media LLC
- Volume
- 132
- Issue
- 5
- Publication date
- 9 April 2026
- Language
- EN