Analog circuit fault diagnosis based on feature attention

Analog Integrated Circuits and Signal Processing 2026 Open access

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Authors: Xianjun Du, Yan Yin, Lei Cao, Shengyi Cheng

DOI: 10.1007/s10470-026-02590-6

Cited by: 0

References: 25

Fields of Study & Subjects

Integrated Circuits and Semiconductor Failure Analysis Industrial Vision Systems and Defect Detection VLSI and Analog Circuit Testing

References 25