Numerical simulation of single-event burnout effects in p-GaN gate HEMTS

Journal of Computational Electronics 2026

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Authors: JinLong Wang, JiaRui Zhao, Yanfei Zhang, Kai Sun, MengXin Liu

DOI: 10.1007/s10825-025-02490-4

Cited by: 1

References: 23

Fields of Study & Subjects

GaN-based semiconductor devices and materials Radiation Effects in Electronics Photocathodes and Microchannel Plates

References 23