The shift to data-driven microelectronics: machine learning for MOSFET modeling, design, and reliability

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Authors: Qianhao Zhang, Junjie Guo, Chaoqun Jiang, Jingyu Yao, Zhikuo Tao
Cited by: 1
References: 93

Fields of Study & Subjects

Advancements in Semiconductor Devices and Circuit Design Ferroelectric and Negative Capacitance Devices Semiconductor materials and devices

Publication details

Journal / source
Journal of Computational Electronics
Publisher
Springer Science and Business Media LLC
Volume
25
Issue
3
Publication date
9 May 2026
Language
EN