GenAD-SM: optimized transformer-VAE model for precision anomaly detection for smart manufacturing in industry 5.0

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Authors: Surjeet Dalal, Surjeet Dalal, Sarita Simaiya, Deo Prakash, Sunita Yadav, Kuldeep Kumar, Ajay Kaushik
Cited by: 6
References: 68

Fields of Study & Subjects

Anomaly Detection Techniques and Applications Digital Transformation in Industry Machine Fault Diagnosis Techniques

Publication details

Journal / source
Journal of Intelligent Manufacturing
Publisher
Springer Science and Business Media LLC
Publication date
8 January 2026
Language
EN