Transductive zero-shot learning for mixed-type defect classification in wafer maps

Journal of Intelligent Manufacturing 2026

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Authors: Jun Liu, Jifei Lu, Tian Chen, Xi Wu, Huaguo Liang, Xiaohui Yuan, Yen Pham

DOI: 10.1007/s10845-025-02775-2

Cited by: 0

References: 52

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications VLSI and Analog Circuit Testing

References 52