SDCViT: a transformer-powered hierarchical framework for semiconductor defect detection and classification

Journal of Intelligent Manufacturing 2026

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Authors: Shaurya Jain, A. Charan Kumari, K. Srinivas

DOI: 10.1007/s10845-026-02797-4

Cited by: 0

References: 49

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Non-Destructive Testing Techniques

References 49