Restricted self-supervised and active learning network for imbalanced few-shot wafer maps defect recognition

Journal of Intelligent Manufacturing 2026

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Authors: Lixiang Zhao, Jiantao Chang, Jianbo Yu

DOI: 10.1007/s10845-026-02880-w

Cited by: 1

References: 61

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Machine Learning and ELM Machine Learning and Algorithms

References 61