Few-shot mask-guided controllable anomaly image generation via inpainting diffusion for surface defect detection
Fields of Study & Subjects
Generative Adversarial Networks and Image Synthesis
Numerical methods in engineering
Integrated Circuits and Semiconductor Failure Analysis
Publication details
- Journal / source
- Journal of Intelligent Manufacturing
- Publisher
- Springer Science and Business Media LLC
- Publication date
- 15 June 2026
- Language
- EN