Negative dielectric and inductive behavior in Au/n-Si diodes with Ni-doped PVP interlayers

Journal of Materials Science Materials in Electronics 2026

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Authors: I. M. Afandiyeva, E. R. Bakhtiyarli, S. Altındal Yerişkin, Sabreen A. Hameed
DOI: 10.1007/s10854-026-16574-9
Cited by: 2
References: 54

Fields of Study & Subjects

Semiconductor materials and interfaces Copper Interconnects and Reliability Dielectric properties of ceramics

Publication details

Journal / source
Journal of Materials Science Materials in Electronics
Publisher
Springer Science and Business Media LLC
Volume
37
Issue
4
Publication date
1 February 2026
Language
EN