Recombination Rate of D Atoms in Solid D$$_2$$ in the Temperature Range from 0.23 to 1.64 K

Abstract The recombination rates of D atoms in solid D $$_2$$ 2 films were measured in the temperature range 0.23– $$1.64\,\textrm{K}$$ 1.64 K . Atoms were formed in thin D $$_2$$ 2 films by maintaining radio-frequency discharge above the film surface for several days. After stopping discharge the decay of D atoms concentrations was monitored at different temperatures by the method of electron spin resonance (ESR). Decreasing the films temperature from 1.64 to 0.23 K resulted in reducing the recombination rate from $$7.2\times 10^{-26}\,\textrm{cm}^3\textrm{s}^{-1}$$ 7.2 × 10 - 26 cm 3 s - 1 to $$1.0\times 10^{-27}\,\textrm{cm}^3\textrm{s}^{-1}$$ 1.0 × 10 - 27 cm 3 s - 1 .