XOR logical stochastic resonance automatically extracts X-ray imaging abnormal features to improve the detection efficiency of mass PCB welding defects

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Authors: Jianhua Yang, Mengen Shen, Heng Liu, Wenbo Jiang, Zhongqiu Wang
Cited by: 1
References: 35

Fields of Study & Subjects

stochastic dynamics and bifurcation Electronic Packaging and Soldering Technologies Probabilistic and Robust Engineering Design

Publication details

Journal / source
Nonlinear Dynamics
Publisher
Springer Science and Business Media LLC
Volume
114
Issue
3
Publication date
1 February 2026
Language
EN