Advances in high dielectric constant cerium oxide and its doped variants for the surface passivation of 4H-silicon carbide and silicon semiconductors

Optical and Quantum Electronics 2026

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Authors: Abdul Shekkeer Kammutty Musliyarakath, 芦秀玲, Hock Jin Quah

DOI: 10.1007/s11082-026-08861-w

Cited by: 1

References: 195

Fields of Study & Subjects

Semiconductor materials and devices Semiconductor materials and interfaces Copper Interconnects and Reliability

References 195