YOLO-VCL: a lightweight and high-precision PCB defect detection network model

Journal of Real-Time Image Processing 2026

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Authors: Wenbo Zhang, Wei J. Chen, Yunfeng Ni, Shouhua Wang, Bei Dang
DOI: 10.1007/s11554-026-01858-4
Cited by: 5
References: 19

Fields of Study & Subjects

Advanced Neural Network Applications Industrial Vision Systems and Defect Detection Advanced Data and IoT Technologies

Publication details

Journal / source
Journal of Real-Time Image Processing
Publisher
Springer Science and Business Media LLC
Volume
23
Issue
2
Publication date
10 February 2026
Language
EN