EDFW-YOLO: enhancing YOLOv8 for quantitative analysis of surface defects in hot-rolled strips

Optoelectronics Letters 2026

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Authors: Jiahao Zhu, Dongmei Ma, Zhitao Zheng, Denghui Wang

DOI: 10.1007/s11801-026-4187-0

Cited by: 1

References: 13

Fields of Study & Subjects

Advanced Neural Network Applications Industrial Vision Systems and Defect Detection Infrastructure Maintenance and Monitoring

References 13