Instance-Aware Pseudo-Labeling and Class-Focused Contrastive Learning for Weakly Supervised Domain Adaptive Segmentation of Electron Microscopy

Neuroinformatics 2026 Open access

Read full text

Authors: Shan Mei Xiong, Jiabao Chen, Yu Wang, Jialin Peng

DOI: 10.1007/s12021-026-09786-1

Cited by: 0

References: 44

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Domain Adaptation and Few-Shot Learning Cell Image Analysis Techniques

References 44