Real-time morphological investigation of early growth of chemical-solution-deposited semiconducting PbS thin films by liquid-adapted atomic force microscopy
Fields of Study & Subjects
Quantum Dots Synthesis And Properties
Chalcogenide Semiconductor Thin Films
Force Microscopy Techniques and Applications
Publication details
- Journal / source
- Bulletin of Materials Science
- Publisher
- Springer Science and Business Media LLC
- Volume
- 49
- Issue
- 3
- Publication date
- 22 August 2026
- Language
- EN