Few-Shot Industrial Defect Detection via Diffusion-Based Data Augmentation with Geometric Pattern Masks

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Authors: Masaya Oirase, Eisuke Kita
Cited by: 1
References: 20

Fields of Study & Subjects

Generative Adversarial Networks and Image Synthesis Domain Adaptation and Few-Shot Learning Industrial Vision Systems and Defect Detection

Publication details

Journal / source
The Review of Socionetwork Strategies
Publisher
Springer Science and Business Media LLC
Volume
20
Issue
2
Pages
449-483
Publication date
1 June 2026
Language
EN