Reliability-Oriented Design of Source-All-Around Vertical TFETs: Mitigation Strategies for Noise, Interface Traps, and Thermal Instability

Silicon 2026

View at publisher

Authors: P L Ramesh, Sirisha Meriga, Bijit Choudhuri

DOI: 10.1007/s12633-025-03592-1

Cited by: 0

References: 29

Fields of Study & Subjects

Advancements in Semiconductor Devices and Circuit Design Semiconductor materials and devices Ferroelectric and Negative Capacitance Devices

References 29